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SPM 2011

22 - 23 June 2011, Edinburgh, United Kingdom


Introduction
Covering a wide range of topics associated with Scanning Probe Microscopy including main techniques such as atomic force microscopy and scanning tunnelling microscopy as well as more specialised versions.

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Venue

Edinburgh, Scotland, United Kingdom

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Organised by
Royal Microscopical Society
Contact information
Miss Victoria Lee
37/38 St Clements, Oxford, OX4 1AJ, United Kingdom
01865 254760
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